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Structural characterisation and analysis

Structural characterisation and analysis tools available

  • High Resolution X-Ray Diffractometers
  • High Resolution Transmission Electron Microscopies (HR-TEMs); also equipped with EDX analysis. Specimen preparation tools (e.g. ion miller, dimpler, focused ion beam tool)
  • High Resolution Scanning Electron Microscopies (SEMs); also equipped with EDX analysis
  • Focused Ion Beam Microscopes; Scanning electron microscope and focused ion beam, gallium source for ion beam, gas injector for platinum deposition.
  • Environmental SEM
  • He-ion Microscope
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